Microchip Announces the 53100A Phase Noise Analyzer for Precision Oscillator Characterization

14.05. 2020 | News
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To help research and manufacturing engineers make precise and accurate measurement of frequency signals, including those generated by atomic clocks and other high-performance frequency reference modules and subsystems, Microchip Technology Inc. announced the availability of the new 53100A Phase Noise Analyzer, a next-generation phase noise test instrument.

The 53100A Phase Noise Analyzer is designed for engineers and scientists who rely on precise and accurate measurement of frequency signals generated for 5G networks, data centers, aircraft systems, space vehicles, communication satellites and metrology applications. Capable of measuring radio frequency (RF) signals up to 200 MHz, the new test instrument rapidly acquires frequency signals and characterizes the phase noise, jitter, Allan deviation (ADEV) and time deviation (TDEV) quickly and precisely. All attributes of a frequency reference can be completely characterized with a single instrument within minutes (more info).

53100A

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