Keysight Introduces High Density Source Measure Unit to Speed Semiconductor Characterization

Keysight Technologies introduces the PZ2100 Series High-Channel Density Precision Source Measure Unit (SMU) Solution, a new SMU solution giving digital development engineers 20 precision SMU channels within a 1U rack space to speed the characterization of integrated circuit (IC) designs.

While innovation cycles are shortening and digital standards are evolving, designing a semiconductor component or device and delivering it to market remains a time-intensive, technical process. Digital development engineers must connect and test multiple ports on a single device-under-test (DUT) throughout the design cycle to troubleshoot and characterize the performance of the IC. Without high-density, automated characterization solutions, engineers risk slowing their delivery timelines as they validate with complex, multiport designs using complicated and low-density test setups.

Keysight’s PZ2100 Series SMU addresses this risk by giving design engineers a high-density SMU solution that is scalable to 20 SMU channels in a compact 1U rack configuration. The solution also speeds time-to-market with flexible software options, simplified system integration and synchronization, and application-specific measurement capabilities, allowing them to focus more time on characterization and less on synchronization (more info).