High-Speed Interconnect Analyzer Delivers Unmatched Characterization Insight

04.07. 2019 | News

Teledyne LeCroy introduced its WavePulser 40iX high-speed interconnect analyzer, a uniquely capable solution for complete interconnect testing and validation. The WavePulser 40iX is the ideal single tool for high-speed hardware designers and test engineers to characterize and analyze interconnects and cables for high-speed serial protocols such as PCI Express, HDMI, USB, SAS, SATA, Fibre Channel, InfiniBand, Gigabit Ethernet, and Automotive Ethernet.

Until now, interconnect testing and validation has been bifurcated between time- and frequency-domain testing. For the former, signal-integrity engineers have used TDRs to characterize step/impulse response by generating an impedance profile. TDRs are characterized by high spatial resolution, enabling precise location of impairments along the transmission line, noted by changes in the impedance profile. For the latter, VNAs, characterized by high dynamic range, are typically used by microwave engineers to measure S-parameters of radio-frequency (RF) components. When adapted to high-speed interconnect testing, VNAs suffer from the need to extrapolate response to DC and from sub-par analysis tools for time-domain simulation, emulation, time gating, and jitter analysis. Neither test instrument fully meets the needs of design engineers who test and validate high-speed interconnects (more info).


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