TI unveils new ADC to enable nanosecond-level telemetry and minimize downtime in AI data centers

Texas Instruments debuted the first analog-to-digital converter to enable 24/7, low-power, event-based remote monitoring at nanosecond resolution. As AI workloads rapidly increase, data center operators face significant challenges around power instability, inadequate real-time monitoring and signal degradation, all of which can lead to costly downtime. TI is addressing these challenges through its new ADC device and other analog solutions designed to tackle the challenges of scaling artificial intelligence infrastructures.

TI's ADC34DSO75 is the industry's highest performance 3 gigasamples per second ADC, enabling 24/7, low-power, event-based remote monitoring at nanosecond resolution – thousands of times faster than what current solutions offer. Existing monitoring solutions often fail to detect the nanosecond-level power-rail glitches that cause costly, unplanned downtime in data centers. By combining ultra-high-speed sampling with advanced on-chip digital signal processing in a small form factor, the ADC34DSO75 detects and captures transient fault events in real time (more info).

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