Hioki Launches Next-Generation CT6704 and CT6705 Current Probes for High-Frequency, Large-Current Measurement

30.06. 2026 | News
Author: Jan Robenek

Hioki announced the launch of the Current Probe CT6704 and Current Probe CT6705, two new current probes designed for current waveform observation in high-frequency, large-current measurement applications. The CT6704 and CT6705 are intended for R&D and evaluation in power electronics, mobility, industrial equipment, and data center-related equipment. Typical applications include current waveform observation in SiC/GaN inverters, DC/DC converters, motor drive circuits, high-frequency power supplies, and battery backup units.

With the launch of these products, Hioki will strengthen its measurement solution offerings for growth markets where power conversion technology is becoming increasingly important, including electrification, renewable energy, and data centers.

The CT6704 (30MHz / 200A) and CT6705 (15MHz / 500A) use a fluxgate detection method to suppress offset drift caused by sensor self-heating, supporting stable current waveform measurement during long-duration observation and in environments subject to temperature changes (more info).

robenek@dps-az.cz

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